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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Band gap and correlated phenomena in bilayer and trilayer graphene
Lee, Yongjin, George, Thomas, Islam, M. Saif, Myhro, Kevin, Tran, David, Dutta, Achyut K., Gilgren, Nathaniel, Velasco, Jairo, Bao, Wenzhong, Deo, Michael, Lau, Chun NingVolume:
8725
Year:
2013
Language:
english
DOI:
10.1117/12.2016521
File:
PDF, 1.66 MB
english, 2013