[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions
McClure, Steven S., Harris, Richard D., Rax, Bernard G., Thorbourn, Dennis O.Year:
2012
Language:
english
DOI:
10.1109/REDW.2012.6353733
File:
PDF, 425 KB
english, 2012