[IEEE 2012 IEEE Radiation Effects Data Workshop (in...

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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions

McClure, Steven S., Harris, Richard D., Rax, Bernard G., Thorbourn, Dennis O.
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Year:
2012
Language:
english
DOI:
10.1109/REDW.2012.6353733
File:
PDF, 425 KB
english, 2012
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