Materialprobleme der Basiskontakte von schnellen...

Materialprobleme der Basiskontakte von schnellen integrierten Si/SiGe-Heterobipolartransistoren

J. Hohaus, H.-U. Schreiber
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Volume:
31
Year:
2000
Pages:
4
DOI:
10.1002/1521-4052(200009)31:93.0.co;2-8
File:
PDF, 180 KB
2000
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