Quality of thep-Si crystal surface and radiation-stimulated...

Quality of thep-Si crystal surface and radiation-stimulated changes in the characteristics of Bi-Si-Al surface-barrier structures

B. V. Pavlyk, D. P. Slobodzyan, A. S. Hrypa, R. M. Lys, M. O. Kushlyk…
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Volume:
46
Language:
english
DOI:
10.1134/S1063782612080167
Date:
August, 2012
File:
PDF, 296 KB
english, 2012
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