EBSD characterization of twinning in cold-rolled CP-Ti

Materials Characterization 2013 / 10 Vol. 84

EBSD characterization of twinning in cold-rolled CP-Ti

Li, X., Duan, Y.L., Xu, G.F., Peng, X.Y., Dai, C., Zhang, L.G., Li, Z.
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Volume:
84
Language:
english
Journal:
Materials Characterization
DOI:
10.1016/j.matchar.2013.07.008
Date:
October, 2013
File:
PDF, 3.57 MB
english, 2013
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