Gate tunneling currents in ultrathin oxide...

Gate tunneling currents in ultrathin oxide metal–oxide–silicon transistors

Cai, Jin, Sah, Chih-Tang
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Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1337596
File:
PDF, 566 KB
english, 2001
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