![](/img/cover-not-exists.png)
Gate tunneling currents in ultrathin oxide metalâoxideâsilicon transistors
Cai, Jin, Sah, Chih-TangVolume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1337596
File:
PDF, 566 KB
english, 2001