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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Investigation into voltage and process variation-aware manufacturing test
Ingelsson, Urban, Al-Hashimi, Bashir M.Year:
2011
Language:
english
DOI:
10.1109/TEST.2011.6139138
File:
PDF, 938 KB
english, 2011