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Power loss by a two-dimensional hole gas in a Si/Si[sub 0.8]Ge[sub 0.2] heterostructure over a wide temperature range
Kubakaddi, S. S., Katti, V. S., Lehmann, D.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3452351
File:
PDF, 463 KB
english, 2010