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Ni Layer Thickness Dependence of the Interface Structures for Ti/Ni/Ti Trilayer Studied by X-ray Standing Waves
Li, Wenbin, Zhu, Jingtao, Li, Haochuan, Zhang, Zhong, Ma, Xiaoying, Yang, Xiaoyue, Wang, Hongchang, Wang, ZhanshanVolume:
5
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/am3024614
Date:
January, 2013
File:
PDF, 1.73 MB
english, 2013