SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Photoacoustic spectroscopy of semiconductor nanoclusters incorporated into various dielectric matrices
Blonskij, Ivan V., Tkhoryk, Volodymyr A., Tel'biz, German M., Turchack, Roman V., Salnikov, Vadim O., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Year:
1998
Language:
english
DOI:
10.1117/12.306251
File:
PDF, 723 KB
english, 1998