Origin of the vanishing critical thickness for...

Origin of the vanishing critical thickness for ferroelectricity in free-standing PbTiO3 ultrathin films from first principles

Yin, Binglun, Qu, Shaoxing
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4817503
File:
PDF, 1.20 MB
english, 2013
Conversion to is in progress
Conversion to is failed