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Origin of the vanishing critical thickness for ferroelectricity in free-standing PbTiO3 ultrathin films from first principles
Yin, Binglun, Qu, ShaoxingVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4817503
File:
PDF, 1.20 MB
english, 2013