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Temperature and frequency dependencies of AC and dielectric characterizations of copper tetraphenyl porphyrin thin films
El-Nahass, M.M., Farag, A.A.M., Abu-Samaha, F.S.H., Elesh, EmanVolume:
99
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2013.05.012
Date:
January, 2014
File:
PDF, 650 KB
english, 2014