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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Methods for Inspection, Characterization, and Imaging of Biomaterials - Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth
Pellegrino, Mario, Orsini, Paolo, Pellegrini, Monica, Tognoni, Elisabetta, Ascoli, Cesare, Baschieri, Paolo, Dinelli, Franco, Ferraro, Pietro, Ritsch-Marte, Monika, Grilli, Simonetta, Stifter, DavidVolume:
8792
Year:
2013
Language:
english
DOI:
10.1117/12.2021541
File:
PDF, 356 KB
english, 2013