Factors influencing the presence and detection of...

Factors influencing the presence and detection of compositional grading at semiconductor hetero-epitaxial interfaces

M.H. Lyons
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Volume:
96
Year:
1989
Language:
english
Pages:
9
DOI:
10.1016/0022-0248(89)90531-9
File:
PDF, 728 KB
english, 1989
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