Radiation and Fault Injection Testing of a Fine-Grained...

IEEE Transactions on Nuclear Science 2013 / 8 Vol. 60; Iss. 4

Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs

Nazar, Gabriel L., Rech, Paolo, Frost, Christopher, Carro, Luigi
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2261319
Date:
August, 2013
File:
PDF, 609 KB
english, 2013
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