Analytical Modeling of Dielectric Pocket Double-Gate MOSFET...

IEEE Transactions on Device and Materials Reliability 2014 / 03 Vol. 14; Iss. 1

Analytical Modeling of Dielectric Pocket Double-Gate MOSFET Incorporating Hot-Carrier-Induced Interface Charges

Kumari, Vandana, Saxena, Manoj, Gupta, R. S., Gupta, Mridula
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2278077
Date:
March, 2014
File:
PDF, 374 KB
english, 2014
Conversion to is in progress
Conversion to is failed