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Determination of detrapping times in semiconductor detectors
Kramberger, G, Cindro, V, Mandić, I, Mikuž, M, Zavrtanik, MVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/04/P04006
Date:
April, 2012
File:
PDF, 808 KB
english, 2012