Eg versus x relation from photoluminescence and electron...

Journal of Crystal Growth 1990 Vol. 86; Iss. 1-4

Eg versus x relation from photoluminescence and electron microprobe investigations in p-type Hg1−xCdxTe (0.35 ⩽ x ⩽ 0.7)

P. Gille, K.H. Herrmann, N. Puhlmann, M. Schenk, J.W. Tomm, L. Werner
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Volume:
86
Year:
1990
Language:
english
Pages:
6
DOI:
10.1016/0022-0248(90)90781-f
File:
PDF, 410 KB
english, 1990
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