TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18...

TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18 Thin Films on LaNiO3 Bottom Electrodes on CeO2/YSZ-Buffered Si(100)

D. Hesse, N.D. Zakharov, A. Pignolet, A.R. James, S. Senz
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
35
Year:
2000
Language:
english
Pages:
11
DOI:
10.1002/1521-4079(200007)35:6/73.0.co;2-z
File:
PDF, 502 KB
english, 2000
Conversion to is in progress
Conversion to is failed