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TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18 Thin Films on LaNiO3 Bottom Electrodes on CeO2/YSZ-Buffered Si(100)
D. Hesse, N.D. Zakharov, A. Pignolet, A.R. James, S. SenzVolume:
35
Year:
2000
Language:
english
Pages:
11
DOI:
10.1002/1521-4079(200007)35:6/73.0.co;2-z
File:
PDF, 502 KB
english, 2000