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In-situ delineation of defects in ISOVPE-grown Hg1−xCdxTe layers
R.K. Bagai, Meenakshi Srivastava, Kailash Sharma, W.N. BorleVolume:
112
Year:
1991
Language:
english
Pages:
5
DOI:
10.1016/0022-0248(91)90315-v
File:
PDF, 864 KB
english, 1991