[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - Multiphase Technique to Speed-up Delay Measurement via Sub-sampling
Vasudevamurthy, Rajath, Amrutur, BharadwajYear:
2013
Language:
english
DOI:
10.1109/VLSID.2013.186
File:
PDF, 353 KB
english, 2013