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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Characterisation and comparison of ophthalmic instrument quality using a model eye with reverse ray-tracing
Sheil, Conor, Goncharov, Alexander V., Bodermann, Bernd, Frenner, Karsten, Silver, Richard M.Volume:
8789
Year:
2013
Language:
english
DOI:
10.1117/12.2020129
File:
PDF, 778 KB
english, 2013