[IEEE 2013 International Symposium on VLSI Design,...

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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Power and area reduction in multi-stage addition using operand segmentation

Ching-Da Chan,, Wei-Chang Liu,, Chia-Hsiang Yang,, Shyh-Jye Jou,
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Year:
2013
Language:
english
DOI:
10.1109/VLDI-DAT.2013.6533879
File:
PDF, 885 KB
english, 2013
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