Probing Defects in a Small Pixellated CdTe Sensor Using an...

IEEE Transactions on Nuclear Science 2013 / 8 Vol. 60; Iss. 4

Probing Defects in a Small Pixellated CdTe Sensor Using an Inclined Mono Energetic X-Ray Micro Beam

Frojdh, Erik, Frojdh, C., Gimenez, E. N., Krapohl, D., Maneuski, D., Norlin, B., O'Shea, V., Wilhelm, H., Tartoni, N., Thungstrom, G., Zain, R. M.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2257851
Date:
August, 2013
File:
PDF, 1.72 MB
english, 2013
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