Intragrain defects in polycrystalline silicon layers grown by aluminum-induced crystallization and epitaxy for thin-film solar cells
Van Gestel, Dries, Gordon, Ivan, Bender, Hugo, Saurel, Damien, Vanacken, Johan, Beaucarne, Guy, Poortmans, JefVolume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3117838
File:
PDF, 1.93 MB
english, 2009