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High resolution and conventional transmission electron microscopy in the characterisation of thin films and interfaces involving II–VI materials
J.O. Williams, A.C. Wright, H.M. YatesVolume:
117
Year:
1992
Language:
english
Pages:
13
DOI:
10.1016/0022-0248(92)90790-p
File:
PDF, 1.28 MB
english, 1992