[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Small-delay defects detection under process variation using Inter-Path Correlation
Galarza-Medina, Francisco J., Garcia-Gervacio, Jose L., Champac, Victor, Orailoglu, AlexYear:
2012
Language:
english
DOI:
10.1109/VTS.2012.6231091
File:
PDF, 751 KB
english, 2012