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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs
Garcia-Gervacio, Jose L., Champac, VictorYear:
2010
Language:
english
DOI:
10.1109/ETSYM.2010.5512771
File:
PDF, 405 KB
english, 2010