[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Atpg padding and ate vector repeat per port for reducing test data volume
Vranken, H., Hapke, F., Rogge, S., Chindamo, D., Volkerink, E.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/TEST.2003.1271095
File:
PDF, 1007 KB
english, 2003