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Cross-sectional scanning tunneling microscopy of MBE-grown Si p-n junctions and Si/SiGe superlattices
E.T. Yu, M.B. Johnson, V.P. Kesan, A.R. Powell, J.-M. Halbout, S.S. IyerVolume:
127
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0022-0248(93)90655-g
File:
PDF, 394 KB
english, 1993