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SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Design and Engineering of Optical Systems II - Equivalent focal length measurements
Artzner, Guy E., Auchere, Frederic, Delaboudiniere, Jean-Pierre, Hochedez, Jean-Francois E., Merkle, FritzVolume:
3737
Year:
1999
Language:
english
DOI:
10.1117/12.360014
File:
PDF, 238 KB
english, 1999