In situ real-time temperature and thickness measurement for...

In situ real-time temperature and thickness measurement for SiSiGe growth on MBE and RTCVD systems

H. Möller, F.G. Böbel, B. Hertel, T. Lindenberg, G. Ritter
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Volume:
157
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0022-0248(95)00352-5
File:
PDF, 309 KB
english, 1995
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