Effect of RTCVD growth conditions on the crystal quality of pseudomorphic Si1-x-yGexCy films
Jian Mi, Patricia Warren, Pascal Letourneau, Moshe Judelewicz, Marc Gailhanou, Michel DutoitVolume:
157
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0022-0248(95)00407-6
File:
PDF, 346 KB
english, 1995