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X-ray measurements of strains in MOCVD grown thin cap layers of CdTe
A. Raizman, A. Sher, G. CinaderVolume:
159
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0022-0248(95)00852-7
File:
PDF, 254 KB
english, 1996