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Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels
Zlatanov, Nikola, Hadzi-Velkov, Zoran, Karagiannidis, GeorgeVolume:
12
Language:
english
Journal:
IEEE Communications Letters
DOI:
10.1109/LCOMM.2008.081058
Date:
November, 2008
File:
PDF, 202 KB
english, 2008