Calculation of Cross Section for Ion-Induced SEU Through...

Calculation of Cross Section for Ion-Induced SEU Through Direct Ionization in Nanometric Silicon Devices With Small Critical Energy

Murat, Michael, Barak, Joseph, Akkerman, Avraham
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273291
Date:
August, 2013
File:
PDF, 1.91 MB
english, 2013
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