Calculation of Cross Section for Ion-Induced SEU Through Direct Ionization in Nanometric Silicon Devices With Small Critical Energy
Murat, Michael, Barak, Joseph, Akkerman, AvrahamVolume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273291
Date:
August, 2013
File:
PDF, 1.91 MB
english, 2013