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SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V - Search for optimal infrared projector nonuniformity correction procedures: II
Swierkowski, Leszek, Williams, Owen M., Murrer, Jr., Robert LeeVolume:
4027
Year:
2000
Language:
english
DOI:
10.1117/12.391690
File:
PDF, 431 KB
english, 2000