SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday...

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SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV - Search for optimal infrared projector nonuniformity correction procedures

Williams, Owen M., Murrer, Jr., Robert Lee
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Volume:
3697
Year:
1999
Language:
english
DOI:
10.1117/12.352915
File:
PDF, 650 KB
english, 1999
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