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A novel characterization scheme for organic field-effect transistors
Dost, René, Das, Arindam, Grell, MartinVolume:
40
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/40/12/003
Date:
June, 2007
File:
PDF, 291 KB
english, 2007