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SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - A generic x-ray tracing toolbox in Geant4
Vacanti, Giuseppe, Buis, Ernst-Jan, Collon, Maximilien, Beijersbergen, Marco, Kelly, Chris, Hudec, René, Pina, LadislavVolume:
7360
Year:
2009
Language:
english
DOI:
10.1117/12.821768
File:
PDF, 1.15 MB
english, 2009