[IEEE 2010 24th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Braunschweig, Germany (2010.08.30-2010.09.3)] 24th ISDEIV 2010 - Numerical simulation of secondary electron emission yield in the case of volume and surface trapping evolution
Aoufi, A., Damamme, G.Year:
2010
Language:
english
DOI:
10.1109/DEIV.2010.5625775
File:
PDF, 3.35 MB
english, 2010