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Measurements of antiphase boundary and complex stacking fault energies in binary and B-doped Ni 3 Al using TEM
Hemker, K. J., Mills, M. J.Volume:
68
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418619308221207
Date:
August, 1993
File:
PDF, 1.29 MB
english, 1993