Impact of technology trends on SEU in CMOS SRAMs

IEEE Transactions on Nuclear Science 1996 / Dec. Vol. 43; Iss. 6

Impact of technology trends on SEU in CMOS SRAMs

Dodd, P.E., Sexton, F.W., Hash, G.L., Shaneyfelt, M.R., Draper, B.L., Farino, A.J., Flores, R.S.
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Volume:
43
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.556869
Date:
January, 1996
File:
PDF, 985 KB
english, 1996
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