Modeling the Rate-Dependent Durability of Reduced-Ag SAC...

Journal of Electronic Materials 2013 / 08 Vol. 42; Iss. 8

Modeling the Rate-Dependent Durability of Reduced-Ag SAC Interconnects for Area Array Packages Under Torsion Loads

Vikram Srinivas, Sandeep Menon, Michael Osterman…
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Volume:
42
Language:
english
DOI:
10.1007/s11664-013-2575-2
Date:
August, 2013
File:
PDF, 604 KB
english, 2013
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