[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Efficacy Of Back Propagation Neural Network Based On Various Statistical Measures For Pd Pattern Classification Task
Karthikeyan, B., Gopal, S., Srinivasan, P.S., Venkatesh, S.Year:
2006
Language:
english
DOI:
10.1109/ICPADM.2006.284112
File:
PDF, 4.17 MB
english, 2006