Analysis of mechanisms which lead to electrical breakdown...

Journal of Physics D Applied Physics 2000 / 11 Vol. 33; Iss. 21

Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method

Pejovic, Momcilo M, Ristic, Goran S
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Volume:
33
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/33/21/318
Date:
November, 2000
File:
PDF, 101 KB
english, 2000
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