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Evolution of Microstructure during the Thermal Activation of Copper(II) and Chromium(III) Doubly Promoted Tin(IV) Oxide Catalysts: An FT-IR, XRD, TEM, XANES/EXAFS, and XPS Study
Harrison, Philip G., Lloyd, Nicholas C., Daniell, Wayne, Ball, Ian K., Bailey, Craig, Azelee, WanVolume:
12
Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm001126y
Date:
October, 2000
File:
PDF, 177 KB
english, 2000