Temperature dependence of substrate currents of MOSFETs...

Journal of the Chinese Institute of Engineers 2011 / 04 Vol. 34; Iss. 3

Temperature dependence of substrate currents of MOSFETs under different drain and gate biases

Liu, Chuan-Hsi, Chen, Shuang-Yuan, Tu, Chia-Hao, Huang, Heng-Sheng, Chou, Sam, Ko, Joe
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Volume:
34
Language:
english
Journal:
Journal of the Chinese Institute of Engineers
DOI:
10.1080/02533839.2011.565620
Date:
April, 2011
File:
PDF, 448 KB
english, 2011
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