A Scan Cell Design for Scan-Based Debugging of an SoC With...

IEEE Transactions on Circuits and Systems II: Express Briefs 2010 / 07 Vol. 57; Iss. 7

A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains

Yi, Hyunbean, Kundu, Sandip, Cho, Sangwook, Park, Sungju
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Volume:
57
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/TCSII.2010.2049923
Date:
July, 2010
File:
PDF, 352 KB
english, 2010
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