Characterization and Formation Mechanism of Six Pointed...

Journal of Electronic Materials 2013 / 05 Vol. 42; Iss. 5

Characterization and Formation Mechanism of Six Pointed Star-Type Stacking Faults in 4H-SiC

Fangzhen Wu, Huanhuan Wang, Shayan Byrappa…
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Volume:
42
Language:
english
DOI:
10.1007/s11664-012-2379-9
Date:
May, 2013
File:
PDF, 609 KB
english, 2013
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